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Multi-channel transistor including an asymmetrical source/drain contact

机译:多通道晶体管,包括不对称的源极/漏极触点

摘要

A semiconductor device includes a lower interlayer insulating film including a first trench and a second trench adjacent each other; a first gate structure within the first trench and extending in a first direction; a second gate structure within the second trench and extending in the first direction; a source/drain adjacent the first gate structure and the second gate structure; an upper interlayer insulating film on the lower interlayer insulating film; and a contact connected to the source/drain, the contact in the upper interlayer insulating film and the lower interlayer insulating film, wherein the contact includes a first side wall and a second side wall, the first side wall of the contact and the second side wall of the contact are asymmetric with each other, and the contact does not vertically overlap the first gate structure and the second gate structure.
机译:半导体装置具有:下层间绝缘膜,该下层间绝缘膜具有彼此相邻的第一沟槽和第二沟槽;在第一沟槽内并在第一方向上延伸的第一栅极结构;在第二沟槽内并在第一方向上延伸的第二栅极结构;与第一栅极结构和第二栅极结构相邻的源极/漏极;在下层间绝缘膜上的上层间绝缘膜;以及连接到源极/漏极的触点,该触点在上层间绝缘膜和下层间绝缘膜中,其中该触点包括第一侧壁和第二侧壁,该触点的第一侧壁和第二侧面接触件的壁彼此不对称,并且接触件不垂直地重叠第一栅极结构和第二栅极结构。

著录项

  • 公开/公告号US10529859B2

    专利类型

  • 公开/公告日2020-01-07

    原文格式PDF

  • 申请/专利权人 SAMSUNG ELECTRONICS CO. LTD.;

    申请/专利号US201815988623

  • 发明设计人 BYUNG CHAN RYU;JONG HO YOU;HYUNG JONG LEE;

    申请日2018-05-24

  • 分类号H01L29/78;H01L29/417;H01L23/522;H01L27/088;H01L29/66;H01L21/8234;H01L21/768;H01L29/165;

  • 国家 US

  • 入库时间 2022-08-21 11:18:57

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