ATOMIC FORCE MICROSCOPE PROBE WRAPPED WITH TWO-DIMENSIONAL LAYERED STRUCTURE, PREPARATION METHOD THEREFOR, AND APPLICATION THEREOF

摘要

An atomic force microscope probe wrapped with a two-dimensional layered material, preparation method therefor, and application thereof. The probe comprises: a cantilever (10); a truncated-cone needle (20) protruding from the surface of the cantilever (10); and a two-dimensional layered material sheet (30) coated on a top surface (22) and at least part of a side surface (24) of the truncated-cone needle (20).