PANEL DEFECT ANALYSIS METHOD AND APPARATUS, STORAGE MEDIUM AND NETWORK DEVICE

摘要

Disclosed are a panel defect analysis method and apparatus, a storage medium and a network device. In the embodiments of the present application, the method comprises: acquiring a panel image corresponding to a panel to be analyzed; detecting a defect in the panel image to obtain the position and type of the defect; performing circuit region segmentation on the panel image according to a pre-set strategy to obtain a circuit segmentation image comprising a plurality of circuit regions; intercepting, according to the position of the defect, a circuit region where the defect is located from the circuit segmentation image to obtain an image to be analyzed; and analyzing, by means of a machine learning model and based on the image to be analyzed and the type of the defect, the influence of the defect on a circuit in the panel to obtain a defect analysis result.