首页> 外国专利> FORMATION OF THREE-DIMENSIONAL STRUCTURES USING GREY-SCALE PHOTOLITHOGRAPHY

FORMATION OF THREE-DIMENSIONAL STRUCTURES USING GREY-SCALE PHOTOLITHOGRAPHY

机译:灰度光照相法在三维结构上的形成

摘要

Forming a three-dimensional structure includes applying photoresist on a layer and using a photolithography system to expose the photoresist. The photolithography system includes a photomask having a pattern thereon, where the pattern provides varying pattern density across a surface of the photomask and has a pitch that is less than a resolution of the photolithography system. The method includes subsequently developing the photoresist such that photoresist remaining on the layer has a three-dimensional profile defined by the photomask. An isotropic etchant is used to etch the layer such that the three-dimensional profile of the photoresist is transferred to the layer.
机译:形成三维结构包括在层上施加光刻胶并使用光刻系统曝光光刻胶。光刻系统包括在其上具有图案的光掩模,其中该图案在光掩模的整个表面上提供变化的图案密度,并且其节距小于光刻系统的分辨率。该方法包括随后显影光致抗蚀剂,使得保留在该层上的光致抗蚀剂具有由光掩模限定的三维轮廓。使用各向同性蚀刻剂来蚀刻该层,以使光致抗蚀剂的三维轮廓转移到该层上。

著录项

  • 公开/公告号WO2020108973A2

    专利类型

  • 公开/公告日2020-06-04

    原文格式PDF

  • 申请/专利权人 AMS AG;

    申请/专利号WO2019EP80905

  • 发明设计人 KUSAR PRIMOZ;EILMSTEINER GERHARD;

    申请日2019-11-11

  • 分类号G03F7/20;

  • 国家 WO

  • 入库时间 2022-08-21 11:11:00

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