The present invention provides an induction coupled plasma analysis system for measuring the light emission state of a plasma to which a sample of an object to be measured is supplied, the induction coupled plasma analysis system being provided with a spectroscope for decomposing emitted light in a measurement region set in a plasma into a plurality of wavelength components, a detection device for detecting the spatial distribution of the decomposed light, and a measurement device for measuring the detected spatial distribution at least for each of a measurement unit time which is shorter than the time taken for the sample to pass through the measurement region.
展开▼
