首页> 外国专利> ELECTRONIC COMPONENT TEST HANDLER HAVING HAND TEACHING FUNCTION AND HAND TEACHING METHOD USING SAME

ELECTRONIC COMPONENT TEST HANDLER HAVING HAND TEACHING FUNCTION AND HAND TEACHING METHOD USING SAME

机译:具有手动教学功能的电子组件测试处理程序和使用该方法的手动教学方法

摘要

The present invention relates to a test handler having a hand teaching function and a hand teaching method using same, the test handler comprising: a plurality of sites where devices are picked up or placed; reference points disposed adjacent to the plurality of sites, respectively; and a hand configured to transfer a device and including a sensor unit configured to calculate the position of a reference point in a non-contact manner. By the electronic component test handler having a hand teaching function and the hand teaching method using same, according to the present invention, an error which may occur due to repeated use or a position error required to be corrected according to exchange of kits can be automatically corrected using a reference groove, so that a separate work for position correction is not required and thus convenience and efficiency can be improved.
机译:本发明涉及一种具有手教功能的测试处理器和使用该测试处理器的手教学方法,该测试处理器包括:在多个位置上拾取或放置设备;分别邻近多个位置设置的参考点;构造成传送装置的手,并且包括构造成以非接触方式计算参考点的位置的传感器单元。根据本发明,通过具有手教功能的电子零件测试处理器及其使用方法,能够自动地发生由于重复使用而引起的错误或根据套件的更换需要校正的位置错误。使用参考槽进行校正,从而不需要单独的位置校正工作,从而可以提高便利性和效率。

著录项

  • 公开/公告号WO2020213879A1

    专利类型

  • 公开/公告日2020-10-22

    原文格式PDF

  • 申请/专利权人 ATECO INC.;

    申请/专利号WO2020KR04732

  • 发明设计人 LEE TAEK SEON;YEO DONG HYUN;RYU IL HA;

    申请日2020-04-08

  • 分类号G01R31/28;H01L21/677;H01L21/67;

  • 国家 WO

  • 入库时间 2022-08-21 11:08:54

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