首页> 外国专利> Sample surface preparation method, sample surface analysis method, electric field-assisted oxidation probe, and scanning probe microscope equipped with the same

Sample surface preparation method, sample surface analysis method, electric field-assisted oxidation probe, and scanning probe microscope equipped with the same

机译:样品表面制备方法,样品表面分析方法,电场辅助氧化探针和配备有该方法的扫描探针显微镜

摘要

A method of manufacturing a sample surface on which marking is formed, wherein the marking is a local oxide film formed locally on the sample surface, and the local oxide film is placed between the probe and the sample surface in a state in which the tip of the probe and the sample surface are in contact. The manufacturing method is provided in which the probe is formed by applying a voltage, and the probe is brought into contact with the surface of the sample after being subjected to a water supply treatment.
机译:一种制造在其上形成标记的样品表面的方法,其中,标记是在样品表面上局部形成的局部氧化膜,并且该局部氧化膜在探针的尖端与样品表面之间放置的状态为:探头和样品表面接触。提供一种制造方法,其中通过施加电压来形成探针,并且在进行供水处理之后使探针与样品的表面接触。

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