首页> 外国专利> PHASE CHANGE RANDOM ACCESS MEMORY ELEMENT FOR IMPROVING RESISTANCE DRIFT AND DYNAMIC RESISTANCE DRIFT COMPENSATION METHOD OF THE SAME

PHASE CHANGE RANDOM ACCESS MEMORY ELEMENT FOR IMPROVING RESISTANCE DRIFT AND DYNAMIC RESISTANCE DRIFT COMPENSATION METHOD OF THE SAME

机译:改善电阻漂移的相变随机存取存储器元件及其动态电阻补偿方法

摘要

Disclosed are a phase change memory device for improving resistance drift, and a method for compensating dynamic resistance drift of the phase change memory device. According to an embodiment, a phase change memory device includes: a plurality of bit lines; A plurality of source lines disposed to cross the plurality of bit lines; A plurality of memory cells configured to include respective phase change layers and disposed at intersections of the plurality of bit lines and the plurality of source lines; A current generator connected to the plurality of bit lines and generating a set current to be supplied to each of the plurality of memory cells; And a control driver that controls the current generator and the plurality of bit lines so that the set current is supplied to each of the plurality of memory cells.
机译:公开了一种用于改善电阻漂移的相变存储器件以及用于补偿该相变存储器件的动态电阻漂移的方法。根据一个实施例,一种相变存储器件包括:多条位线;和多个源极线设置成与多个位线交叉;多个存储单元,其被配置为包括各自的相变层,并被布置在所述多个位线和所述多个源极线的交叉处;电流发生器连接到多条位线并产生设置电流以提供给多个存储单元中的每一个;控制驱动器,其控制电流产生器和多条位线,以将设定电流提供给多个存储单元中的每一个。

著录项

  • 公开/公告号KR102157358B1

    专利类型

  • 公开/公告日2020-09-18

    原文格式PDF

  • 申请/专利权人 삼성전자 주식회사;

    申请/专利号KR20190001783

  • 发明设计人 송윤흡;최준태;

    申请日2019-01-07

  • 分类号G11C13;

  • 国家 KR

  • 入库时间 2022-08-21 11:03:47

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