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PHASE CHANGE RANDOM ACCESS MEMORY ELEMENT FOR IMPROVING RESISTANCE DRIFT AND DYNAMIC RESISTANCE DRIFT COMPENSATION METHOD OF THE SAME
PHASE CHANGE RANDOM ACCESS MEMORY ELEMENT FOR IMPROVING RESISTANCE DRIFT AND DYNAMIC RESISTANCE DRIFT COMPENSATION METHOD OF THE SAME
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机译:改善电阻漂移的相变随机存取存储器元件及其动态电阻补偿方法
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摘要
Disclosed are a phase change memory device for improving resistance drift, and a method for compensating dynamic resistance drift of the phase change memory device. According to an embodiment, a phase change memory device includes: a plurality of bit lines; A plurality of source lines disposed to cross the plurality of bit lines; A plurality of memory cells configured to include respective phase change layers and disposed at intersections of the plurality of bit lines and the plurality of source lines; A current generator connected to the plurality of bit lines and generating a set current to be supplied to each of the plurality of memory cells; And a control driver that controls the current generator and the plurality of bit lines so that the set current is supplied to each of the plurality of memory cells.
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