Method for determining the development over time of an operating parameter of a power semiconductor module and power semiconductor module

摘要

There is a power semiconductor module and a method for algorithmic determination of the temporal development of at least one first operating parameter of this power semiconductor module with at least one power semiconductor component, with a plurality of input module parameters and at least one input operating parameter for determining the temporal development, the latter in particular the temporal target profile of the output current of the power semiconductor module is used and the temporal development of this first operating parameter is determined by means of two algorithms, the first algorithm being used in a first high frequency range of the output current and the first operating parameter being determined only once for more than one period of the output current, and the second algorithm being used in a second low frequency range of the output current, the first being per period of the output current Operating parameters are determined several times or, in the case of an output current in the form of a temporary direct current, the first operating parameters are determined several times in a period of time assigned to them.