PLATFORM FOR ENABLING SCAN DESIGN BASED ON MACHINE LEARNING

摘要

Electronic design automation (EDA) of the present disclosure, in various embodiments, optimizes electronic circuit design, simulation, analysis, and verification for an electronic device. The electronic device contains scan flip-flops for autonomous testing of the electronic circuit for various manufacturing defects. The EDA of the present invention groups the scan flip-flops into scan chains such that scan flip-flops share similar properties, parameters or attributes within each scan chain. Thereafter, the EDA of the present disclosure intelligently arranges the order for the scan flip-flops within each of the scan chains to optimize performance, performance, and / or area of the electronic circuit.