MACHINE-LEARNING BASED SCAN DESIGN ENABLEMENT PLATFORM

摘要

In various embodiments, electronic design automation (EDA) of the present disclosure optimizes the design, simulation, analysis, and verification of electronic circuit portions for electronic devices. Electronic devices include scan flip-flops that autonomously test electronic circuitry for various manufacturing defects. The EDA of the present invention statistically groups scan flip-flops into scan chains in such a way that the scan flip-flops within each scan chain share similar characteristics, parameters, or properties. Thereafter, the EDA of the present disclosure intelligently arranges the order of the scan flip-flops within each of the scan chains to optimize the power, performance, and/or area of the electronic circuitry.