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Socket for semiconductor device test

摘要

This research is a socket for testing semiconductor components,Especially the individual replacement of the pin,This research and socket body,In order to enable one side of the socket to open and close, a socket cover fixed by a hinge is used,At the edge of the chip installation part of the socket body is provided with a plurality of four corner shape socket pins, which are arranged on the sockets for semiconductor component test,Combine the above pin with other guides,Detach the pin from the socket font,It can be inlaid and fixed, and individual hair clips can be replaced,The front end screw is connected to the fixed end formed by the edge of the chip placement part of the socket body,changeless.

著录项

  • 公开/公告号KR960015616U

    专利类型实用新型

  • 公开/公告日1996.05.17

    原文格式PDF

  • 申请/专利权人 엘지반도체주식회사;

    申请/专利号KR19940027620

  • 发明设计人 이정식;

    申请日1994.10.22

  • 分类号H01L21/66;

  • 国家 KR

  • 入库时间 2022-08-21 10:59:33

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