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Socket or adapter device for semiconductor devices, method for testing semiconductor devices, and system comprising at least one socket or adapter device
Socket or adapter device for semiconductor devices, method for testing semiconductor devices, and system comprising at least one socket or adapter device
The invention relates to a method for testing semiconductor devices, to a system including at least one socket or adapter device, and to a socket or adapter device, in particular for semiconductor devices, having at least one connection pin which is designed such that it is adapted to be introduced into a corresponding contact device of a device to which the socket or adapter device is to be connected, wherein the connection pin is designed such that a clamping connection is provided between the contact device and the connection pin when the connection pin is introduced into the contact device.
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