Image inspector generation device, image inspection device, image inspector generation program, and image inspector generation method

摘要

An image inspection device generation device, an image inspection device generation program, and an image inspection device generation method capable of generating an image inspection device with high inspection accuracy without requiring a large amount of images. An image inspection device generation device (50) generates an image inspection device (33) that inspects an inspection object included in an image by machine learning based on an inspection reference (32) for an inspection object and a learning image LG. The inspection standard 32 includes the unit 45, and includes the state variable of the inspection object, the state value of the state variable, and information of the class into which the inspection object is classified. [Selection diagram] Figure 1