首页> 外国专利> VORRICHTUNG ZUM MESSEN EINES VON EINER PROBE RÜCKGESTREUTEN OPTISCHEN SIGNALS

VORRICHTUNG ZUM MESSEN EINES VON EINER PROBE RÜCKGESTREUTEN OPTISCHEN SIGNALS

摘要

The invention relates to a device for measuring an optical signal produced by a sample comprising:a light source (10) capable of emitting a light beam (20) towards a surface of said sample (50), so as to form, on said surface, an elementary illumination zone (18),at least one detection optical fiber (22) extending between a proximal end (24), capable of being coupled to a photodetector (40), and a distal end (26), capable of collecting an optical signal (52); ) backscattered by said sample when exposed to said light beam,an optical system (30) having a magnification factor (G) and an optical axis (Z '),said optical system (30) being able to conjugate the distal end of each detection optical fiber (26) to an elementary detection zone (28, 28n) located on the surface of the sample,such that the distance (Dn), said backscattering distance, between the elementary illumination zone (18) and each elementary detection zone (28, 28n), perpendicular to said optical axis, is a function of said magnification factor, the device being configured such that at least one elementary detection zone is separated from said illumination zone, the backscattering distance separating said elementary detection zone from said elementary illumination zone being less than 200 microns.

著录项

  • 公开/公告号EP3054281B1

    专利类型

  • 公开/公告日2020.07.29

    原文格式PDF

  • 申请/专利权人

    申请/专利号EP16154145.3

  • 发明设计人

    申请日2016.02.03

  • 分类号

  • 国家 EP

  • 入库时间 2022-08-21 10:56:48

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