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THE INDEX OF REFRACTION EFFECT ON ABSOLUTE FLUORESCENCEnMEASUREMENTS

机译:折射效应对绝对荧光测量的指标

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摘要

The spatial distribution and the total quantity of light escaping from a phosphor depends on geometric shape and index of refraction (n). Measurements taken far out on the normal to a plane face, must be corrected by a factor of n ² Measure¬ments taken off the normal, or close in to the phosphor, or measurements of total light output, are difficult to analyze correctly in the general case. An analysis of previous efficiency measurements is presented. Most of them are subject to com-plex, though probably small corrections

著录项

  • 作者

    Allan Shepp;

  • 作者单位
  • 年度 1956
  • 页码 1-11
  • 总页数 11
  • 原文格式 PDF
  • 正文语种 eng
  • 中图分类 工业技术;
  • 关键词

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