Role of the Reflection Coefficient in Precision Measurement of Ultrasonic Attenuation

摘要

Ultrasonic attenuation measurements using contact, pulse-echo techniques are sensitive to surface roughness and couplant thickness variations. This can reduce considerable inaccuracies in the measurement of the attenuation coefficient for broadband pulses. Inaccuracies arise from variations in the reflection coefficient at the buffer-couplant-sample interface. The reflection coefficient is examined as a function of the surface roughness and corresponding couplant thickness variations. Interrelations with ultrasonic frequency are illustrated. Reliable attenuation measurements are obtained only when the frequency dependence of the reflection coefficient is incorporated in signal analysis. Data are given for nickel 200 samples and a silicon nitride ceramic bar having surface roughness variations in the 0.3 to 3.0 microns range for signal bandwidths in the 50 to 100 MHz range.