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Calculation of Secondary Electron Trajectories in Multistage Depressed Collectors for Microwave Amplifiers

机译:微波放大器多级凹陷采集器二次电子轨迹的计算

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Computational procedures are reported for treating power losses due to secondary electrons in multistage depressed collectors (MDC) for traveling wave tubes (TWT) and other O-type electron tubes. The MDC is modeled with an advanced, multidimensional computer program. Representative beams of secondary electrons are then injected at the points of impact of the primary beams. Separate programs are used to calculate representative beams of high-energy primary electron beams and of low-energy true secondaries. The recomputation of the MDC model including the true secondary beam allows determination of the secondary emission losses, and, if necessary, redesign of the MDC to improve performance. Recomputation of the MDC model including the primary beams is used to check on possible backstreaming from the MDC to the RF interaction structure of the tube. A comparison with experimentally measured values of TWT and MDC efficiencies is made.

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