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Measurement of Lattice Parameter at the Nanometer Scale Using Convergent Beam Microdiffraction from a Thermal Emission Source

机译：利用热发射源的会聚光束微衍射测量纳米尺度的晶格参数

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作者
Pike, W. T.;
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年度 1993
页码 1-2
总页数 2
原文格式 PDF
正文语种 eng
中图分类工业技术;
关键词
ATOMS; CONVERGENCE; CRYSTAL GROWTH; ELECTRON SOURCES; LATTICE PARAMETERS; THERMAL EMISSION; crystal growth Laue zone atomic level CBM electron source holz lines;

机译：原子;收敛;晶体生长;电子源;格子参数;热量排放;晶体生长劳厄区原子级CBm电子源holz线;

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2. Lattice parameter measurement in single crystalline LiCoO2 particles by convergent beam electron diffraction [J] . Gabrisch H, Xing Q Solid state ionics . 2008,第37期

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Measurement of Lattice Parameter at the Nanometer Scale Using Convergent Beam Microdiffraction from a Thermal Emission Source

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