Optical and x-ray imaging of electron beams using synchrotron emission (1995)

摘要

In the case of very low emittance electron and positron storage ring beams, it is impossible to make intrusive measurements of beam properties without increasing the emittance and possibly disrupting the beam. In cases where electron or positron beams have high average power densities (such as free electron laser linacs), intrusive probes such as wires and optical transition radiation screens or Cherenkov emitting screens can be easily damaged or destroyed. The optical and x-ray emissions from the bends in the storage rings and often from linac bending magnets can be used to image the beam profile to obtain emittance information about the beam. The techniques, advantages and limitations of using both optical and x-ray synchrotron emission to measure beam properties are discussed and the possibility of single bunch imaging is considered. The properties of suitable imagers and converters such as phosphors are described. Examples of previous, existing and planned applications are given where available, including a pinhole imaging system currently being designed for the Advanced Photon Source at Argonne National Laboratory.