Application of imaging Raman microscopy to high temperature superconducting ceramics

摘要

An imaging Raman microscope is used to detect and image phases in high-(Tc) superconductor powders, pellets, and silver-sheathed composites. The procedure involves the following series of measurements: (1) spot-focused (< 5 (micro)m) Raman microprobe spectral measurements on isolated crystallites; (2) defocused (3 50 (micro)m) Raman microprobe spectral measurements on isolated crystallites and surrounding area; (3) Raman spatial images of each band in the defocused Raman spectrum; and (4) spot-focused Raman microprobe spectral measurements on selected regions of Raman imaged area (to confirm findings of Raman image analysis). Materials studied were (Bi,Pb)(sub 3)Sr(sub 2)Ca(sub 2)Cu(sub 1)O(sub x), (Ca,Sr)(sub 2)CuO(sub 3), (Ca,Sr)(sub 14)Cu(sub 24)O(sub 41), and Ag/Bi-2223 composite.