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Cl(sub 2)+Ar reactive-ion-beam etching of InGaAlAs for smooth, low- damage definition of asymmetric Fabry-Perot optical transmission modulators

机译:Cl(sub 2)+ ar反应离子束蚀刻InGaalas,用于不对称Fabry-perot光传输调制器的平滑,低损伤定义

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摘要

Cl(sub 2)+Ar Reactive-Ion-Beam Etching is demonstrated for anisotropic, low-damage etching of InAlGaAs semiconductor alloys for use as optical transmission modulators at 1.32 (mu)m wavelength.

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