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Mechanisms for enhanced packaging and/or burn-in total dose sensitivity in microelectronics

机译:在微电子学中增强包装和/或老化总剂量灵敏度的机制

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摘要

The ionizing radiation response of several semiconductor process technologies has been shown to be enhanced by plastic packaging and/or pre-conditioning (burn-in). Potential mechanisms for this effect are discussed and data on bipolar linear circuits are presented.

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