X-RAY AND GAMMA-RAY STUDIES OF HIGH ENERGY ELECTRON SCATTERING EVENTS USING SEMICONDUCTOR DETECTORS

摘要

Using high resolution semiconductor detectors, a study-was made of the large K-ionization cross sections of atoms over a wide range of atomic numbers (Z = 29 to Z = 83) and of incident electron energies (E = 150 MeV to 900 MeV). For the higher Z elements (Z > 60) the L X-ray cross sections were also measured over the incident electron energy range. Ratios of the relative intensities of various distinct lines were determined and compared to recent low energy work. The results of the K-ionization experiment are compared to the recent relativistic calculations of H. Kolbenstvedt. The ex¬perimental K-ionization cross sections for each incident elec¬tron energy appear to fit a power-law dependence on the atomic number.