A FIELD ION MICROSCOPE FOR THE MEASUREMENT OF THE FIELD IONIZATION CHARACTERISTICS OF INDIVIDUAL ATOMIC PLANES

摘要

A newly designed field ion microscope system has been constructed and tested. The capabilities of the new system are reviewed. The system was used to measure the current-voltage characteristics of a selected (111) tungsten surface plane at 91.7°K. A comparison of measured current-voltage characteristics to theoretically expected low field behavior showed order of magnitude agreement for the characteristics and a slightly lower d(log i)/d(log v) than theoretically predicted.