ON GRAIN BONDARY DISLOCATION CONTRAST IN THE ELECTRON MICROSCOPE

摘要

Grain boundary dislocations (GBD’s) may be studied conveniently in the electron microscope using specimens which are prepared by welding together two single crystal films having predetermined orientations to produce a thin-film bicrystal slab containing any type of grain boundary. The boundary is then examined at normal incidence. Problems associated with the imaging of GBD’s in both low and high angle boundaries of this type are considered.