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Phase Plate For Phase-Contrast Electron Microscope, Method For Manufacturing the Same and Phase-Contrast Electron Microscope

机译:相衬电子显微镜用相板,制造方法及相衬电子显微镜

摘要

A phase plate (10) for phase-contrast electron microscopes is characterized by comprising a conductive core phase plate (14) which has a phase plate body (11) and a phase plate support (12) supporting it and is arranged in the path of electrons having passed through the objective lens of an electron microscope and in which the phase plate body (11) is so supported on the phase plate support (12) having an opening (13) as to cover at least a part of the opening (13) and a conductive shield thin film (15) covering the periphery of the core phase plate (14) including the upper and lower sides thereof. Consequently, a phase plane for phase-contrast electron microscopes preventing the lens effect incident to charging completely and applicable to the field of material science, its manufacturing method and a phase-contrast electron microscope can be provided.
机译:用于相衬电子显微镜的相板( 10 )的特征在于,它包括一个导电的芯相板( 14 ),其具有相板主体( 11 < / B>)和支撑它的相板支架( 12 )并布置在通过电子显微镜物镜的电子路径中,并且相板主体( 11 )被支撑在具有开口( 13 )的相板支架( 12 )上,以覆盖至少一部分开口( 13 )和覆盖芯相位板( 14 )的上,下两面的导电屏蔽薄膜( 15 )。因此,可以提供一种用于相衬电子显微镜的相平面,其可以完全防止入射到充电的透镜效应,并且可以应用于材料科学领域,其制造方法以及相衬电子显微镜。

著录项

  • 公开/公告号US2008202918A1

    专利类型

  • 公开/公告日2008-08-28

    原文格式PDF

  • 申请/专利权人 KUNIAKI NAGAYAMA;RADOSTIN DANEV;

    申请/专利号US20050791964

  • 发明设计人 KUNIAKI NAGAYAMA;RADOSTIN DANEV;

    申请日2005-12-02

  • 分类号C23C16/06;C23C16/26;C23C14/14;C23C14/06;C23C14/32;

  • 国家 US

  • 入库时间 2022-08-21 20:15:42

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