Specifications for an Inductively Coupled Plasma Simultaneous Multielement Analysis System

摘要

Specifications are presented for those items of hardware, software, and overall system performance which are of known importance in atomic emission spectroscopy--simultaneous multielement analyses (ICP-SMA) instrument systems. Particular attention is directed to the specified data reporting and quality assurance features which are required for improving the validity and interpretability of the analytical results, and the specified background correction procedures which are necessary for accurate quantitative determinations near the limit of detection. The specification package was prepared to specify and purchase an ICP-SMA system which will provide maximum value and utility for the simultaneous determination of major, minor and trace quantities of the elements in a wide variety of sample materials. Modifications of the analytical line array specified here may be appropriate for other, more specific, analytical tasks. Budgetary realities may necessitate additional, appropriate modifications. It is anticipated, however, that the specification package presented here will have general utility as a guide in the preparation of ICP-SMA procurement packages for other laboratories and other analytical applications. (ERA citation 03:045112)