Proton Microbeam Deflection System to Scan Target Surfaces

摘要

A system to deflect the proton beam within the Karlsruhe microbeam setup is described. The deflection is achieved within a transverse electrical field generated between parallel electrodes. Their potential is controlled by a pattern generator, this method enabling areal and line scans with a variable number of scan points at variable scan speed. The application is demonstrated in two different examples. (Atomindex citation 10:484867)