Dormant Storage Reliability Assessments-Data Based

摘要

A relatively large amount of data pertaining to the performance of certain electronic parts after long periods of dormant storage has been collected and analyzed by the Reliability Department of Sandia National Laboratories. The failure models used by Sandia are presented and reliability assessments for selected electronic parts derived from these models and the measured performance data are provided. These data based assessments are compared to similar assessments derived from handbook calculations using the general data and models provided in the handbooks. (ERA citation 06:015971)