Positron Lifetime and Doppler Broadening Techniques Applied to Irradiation-Damaged Silver

摘要

Positron lifetime and Doppler broadening measurements have been used to study defect production resulting from room temperature irradiation of pure silver by D-T fusion neutrons or energetic protons. Use of the positron annihilation analysis has established that the surviving defects from both irradiations have the same dose dependence and that defect concentration can be quantitatively measured and compared to damage models. The relative merit of the lifetime and Doppler broadening measurements in arriving at these conclusions is discussed in this report along with some practical aspects of the measurements. In the proton damaged samples the trapping rate approaches saturation, a circumstance which could be misinterpreted if a less extensive data set containing only Doppler broadening data were available. Some remarks about the analysis of positron data and general conclusions about the defect structure are given. 3 figures. (ERA citation 06:030951)