Trace Element Measurements Using White Synchrotron Radiation

摘要

Synchrotron radiation, when used for x-ray fluorescence (XRF) has several advantages over conventional x-ray sources. The group at Brookhaven National Laboratory is developing the equipment and expertise to make XRF measurements with synchrotron radiation. The apparatus is briefly described, along with the alignment techniques. Some minimum detectable limits for trace elements in thin biological standards measured with white light irradiations are presented. (ERA citation 12:016534)