Conversion Electron Moessbauer Spectroscopy Study of RF Sputtered Cd/sub 0.95/ Fe/sub 0.05/ Te Thin Films

摘要

Conversion electron Moessbauer spectroscopy (CEMS) studies have been performed on Cd/sub 0.95/ Fe/sub 0.05/ Te films grown by r.f. sputtering on quartz and silicon substrates. The CEMS spectra show the presence of Fe/sup 2+/ and Fe/sup 3+/ in the films. The dependence of the population of both ions was studied as a function of substrate temperature, annealing temperature and substrate type. (Atomindex citation 18:091616)