Electronic Structure of Electrodeposited Thin Film CdTe Solar Cells.

摘要

Independent experimental verification done at four research laboratories, namely, Ametek, Colorado State University (CSU), Institute of Energy Conversion (IEC), and Solar Energy Research Institute (SERI) confirm the n-i-p model proposed by Ametek. The experiments done for the verification of the n-i-p structure are the high frequency capacitance-voltage, light and voltage bias quantum efficiency, and EBIC measurements. All experimental evidence suggests that the n-i-p model is appropriate for the existing n-CdS/i-CdTe/p-ZnTe cell structure. From the C-V measurements, the depletion width has been estimated at 1.7-2.0 micrometers and corresponds to the thickness of the CdTe film. This unique thin films device design has resulted in improved stability and a SERI-verified world record single-junction total area AM1.5 global efficiency of 11%. Further refinements in device design and cell processing should result in 12-13% efficiencies for thin-film CdTe solar cells in the not-too-distant future. (ERA citation 13:042926)