Identification of Periodic Structure Characterized from Amorphous Support by Simulation and Processing Techniques

摘要

High resolution electron images that suggest crystalline lattice fringes in a background of amorphous material are difficult to interpret. A new technique of image processing, referred to here as ''background subtraction'', was recently developed to enhance images of such crystalline particles supported on amorphous substrates. However, the interpretation of exact crystalline surfaces on the particle was not straightforward. We have now applied this enhancement technique, previously used on experimental images, to simulated images of small crystals of TiO sub 2 on amorphous substrates of SiO sub 2 . Additionally, other commonly-used processing techniques are introduced as comparisons for the ''background subtraction'' method to point out its advantage in defining particle shape and internal structure. 4 refs., 4 figs. (ERA citation 13:043498)