Interfacial Bonding in W/C and W/B sub 4 C Multilayers

摘要

The nature of carbon bonding in W/C and W/B sub 4 C multilayer structures is investigated by Auger electron spectroscopy (AES). The interfacial roughness in these x-ray mirrors directly affects their use as efficient optical elements. A significant contribution to interfacial roughness is the possible presence of second phases, WC in particular for the W/C and W/B sub 4 C combinations. AES depth profiling of the multilayer interfaces is used as a direct method to probe for the existence of WC. 8 refs., 4 figs. (ERA citation 14:011393)