Structure determination of thermal-spray materials using synchrotron x-ray microtomography

摘要

The structure of materials prepared using thermal spray methods is difficult to determine using conventional microscopy of porosimetry methods. The difficulties inherent in these approaches can be circumvented using synchrotron computed microtomography(CMT). An example of the use of CMT to produce a high resolution non- destructive image of a thermal-spray coating is Cr(sub 3)C(sub 2)/NiCr is described here to illustrate the power of this technique.