首页> 美国政府科技报告 >Thickness dependence of vortex pinning in epitaxial Tl-Ca-Ba-Cu-O thin films
【24h】

Thickness dependence of vortex pinning in epitaxial Tl-Ca-Ba-Cu-O thin films

机译:外延Tl-Ca-Ba-Cu-O薄膜中涡旋钉扎的厚度依赖性

获取原文

摘要

The critical current density inferred from magnetization hysteresis for epitaxial Tl(sub 2)Ca(sub 2)Ba(sub 2)Cu(sub 3)O(sub 10) films on LaAlO(sub 3) exhibits a pronounced increase with film thickness in the high-field, high-current regime. This thickness dependence does not extend to comparatively ''thick'' single crystals, however, suggesting that the grain boundaries play a major role in collective vortex pinning for Tl-based superconducting thin films.

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号