Transmission electron microscopy study of thick copper-304 stainless steel multilayers.

摘要

Thick (10 to 25 (mu)m), free-standing, equal layer thickness, Copper(Cu)-304 Stainless Steel(SS) multilayer foils, having periods of 1 to 100 nm, synthesized by magnetron sputter deposition, were examined by plan view and cross-sectional transmission electron microscopy. Multilayer growth morphology, individual layer structure and crystallographic phase orientation relationships were characterized in this study. Electron Energy Loss filtered imaging of a 20 nm period multilayer cross-section was also performed and showed that nickel had diffused into the Cu layers from the SS during synthesis. X-ray powder diffraction scans were performed and analyzed. A pure deposit of 304SS was synthesized and had a metastable BCC structure. Multilayer samples having periods of 20 nm were found to have a coherent layered Cu(FCC)SS(FCC) structure. At larger periods (50 & 100 nm) a bimodal Cu(FCC)-SS(FCC & BCC) structure was formed. These observations show that the 304SS will grow with a metastable BCC structure when sputter deposited. When layered with Cu(FCC) the 304SS has its equilibrium FCC structure at layer thicknesses up to 10nm as a result of epitaxy with the copper. At larger SS layer thicknesses the SS appears to locally transform to the metastable BCC structure during synthesis, refining the grain structure of the depositing SS layer and the subsequent Cu layer. This transformation significantly increases the strength of the larger period multilayer.