Detailed Test Report for the Static Acceleration Testing of a cRIO Data Acquisition System.

摘要

The purpose of this test series was to evaluate the suitability of a National Instruments Compact Reconfigurable Input/Output (cRIO) chassis and associated data acquisition cards (c-modules) for use in a mobile test device. The expected environment the VDAS will experience is a 68-g half-sine waveform (of duration approximately 45 milliseconds) followed by a diminishing load over the following 250 milliseconds. Two tests were conducted. The first resulted in ejection of c-modules at 114 g s. This test did not meet the success criteria as defined in the test plan. The second test was successful; no incidents were recorded by the cRIO data acquisition system. The c-modules were not ejected, nor any physical damage observed in the post test visual examination. The cRIO and associated c-modules have demonstrated the ability to survive in a static acceleration environment, tangent to the mounting plane, up to 136 g s.