Studies, Research and Investigations of the Optical Properties of Thin Films of Metals Semiconductors and Dielectrics

摘要

At the time this research was begun, considerable work had already been done in the measurement of optical constants of semi-transparent films by measurement of reflection and transmission coefficients. In seeking an alternate technique of measurement, apparatus developed by O'Bryan was constructed for the measurement of surface values. In attempting to apply this alternate technique to low melting point metals it was found that front and back surfaces of opaque films of these metals exhibited different properties and that quite possibly measurements on the back surfaces would more nearly represent the bulk properties of the metals. The problems encountered in modifying the procedure for light incident through the substrate and some results obtained are the subject of this thesis. (Author)