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Continuum and Lattice Theories of Influence of Electro-Mechanical Coupling on Capacitance of Thin Dielectric Films

机译:电子机械耦合对薄介质薄膜电容影响的连续谱和晶格理论

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It is suggested that an anomaly, observed by C.A. Mead in measurements of the capacitance of thin dielectric films, may be due to an electromechanical effect not accounted for in the classical, continuum theory of piezoelectricity. A solution of equations that include the additional effect is shown to be capable of accommodating the experimental data. It is demonstrated that the augmented equations, rather than the classical ones, are a continuum approximation to the equations of a lattice of shell-model atoms. Analogous equilibrium solutions of the lattice and continuum equations are almost identical. (Author)

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