Measurement of Residual Stress in the XM645 Brass Cartridge Case -- A Limitation of the X-Ray Method.

摘要

It is shown that the X-Ray method of residual stress measurement yields erroneous results when plastic flow has occurred predominantly in one direction, as in the deep drawing of cartridge cases. It is concluded that the subgrain interior regions are uniformly stressed in compression and are counter balanced by cell walls in which significant tensile stresses reside. (Author)