Residual stress measurement with focused acoustic waves and direct comparison with X-ray diffraction stress measurements

摘要

The technique of measuring small changes in acoustic wave velocity due to external or internal stress has been used for quantitative determination of residual stress in materials during the last decade. Application of similar methodology with focused acoustic waves leads to residual stress measurement with spatial resolution of a few millimeters to a few microns. The high spatial resolution residual stress measurement required development of new methodologies in both the design of acoustic lenses and the instrumentation for acoustic wave velocity determination. This paper presents two new methodologies developed for the measurement of residual stress with spatial resolution of a few millimeters. The design of new type of acoustic lens for achieving higher spatial resolution in residual stress measurement is introduced. Development of instrumentation for high precision local surface wave velocity measurement will be presented. Residual stresses measured around a crack tip in a sample of Ti-6Al—4V using a focused beam will be compared with X-ray diffraction measurements performed on the same region of the sample. Results of residual stress measurements along a direction perpendicular to the electron beam weld in a sample of Ti-6Al-4V, determined using focused acoustic waves and X-ray diffraction technique, are also presented. The spatial resolution and penetration depth of X-rays and focused acoustic beams with reference to residual stress measurements are discussed.