Stress Analysis from Powder Diffraction Patterns.

摘要

A brief review of the method of measuring residual stresses in polycrystalline materials with X-rays is given. The effect of counting statistics on precision is discussed as well as factors that affect accuracy. Beam penetration, stress gradients, and the form of the stress tensor can each seriously affect accuracy, if traditional methods are employed, and practical procedures to deal with such situations are outlined. (Author)