State-of-the-Art Assessment of Testing and Testability of Custom LSI/VLSI Circuits. Volume IV. Test Generation

摘要

Two major approaches are considered for generating tests for digital systems: methods based on detailed circuit models of the unit under test (UUT) and methods based primarily on a functional description of the UUT. In addition to test generation of general digital systems, the testing requirements of microprocessors, semiconductor memories and PLA are examined. The D-algorithm and several variants are discussed as a basis for practical test generation procedures. (Author)