首页> 美国政府科技报告 >Investigation of Cement Pastes and Related Materials by Scanning Electron Microscopy and X-Ray Diffraction.
【24h】

Investigation of Cement Pastes and Related Materials by Scanning Electron Microscopy and X-Ray Diffraction.

机译:用扫描电子显微镜和X射线衍射研究水泥浆及相关材料。

获取原文

摘要

Five samples were examined after hydration by scanning electron microscopy (SEM) and both before and after hydration by X-ray diffraction to establish microstructural and compositional data. The majority of the work was done on hydrated material. These samples consisted of three non-expansive cementitious and two expansive cementitious materials. The three non-expansive cementitious materials were an alite, a Type I portland cement, and a Type V portland cement. The two expansive cementitious materials were an ettringite-forming material and a Type K expansive cement.

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号