Relationship between Manufacturing Yields and Field Failure Rates of Electronic Equipment

摘要

This research seeks to determine the degree of correlation between manufacturing yields and field failure rates (operational reliability) of electronic equipment. A designated set of line replaceable units (LRUs) within the avionic subsystems of the A-10A; F-4C/D/E; F-15C and F-16A/B is selected as pilot items in this study, with prime emphasis on the reliability of the printed circuit boards (PCBs) within these units. In Phase I, the data base needed to measure this correlation is established. In Phase II, correlations among these data will be sought. Based on the significance of these correlations, recommendations will be formulated in Phase III to use these research results in Production Readiness Reviews (PRRs) and Risk Assessments for future acquisitions of electronic equipment. (Author)