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首页> 外文期刊>Physica, E. Low-dimensional systems & nanostructures >Anomalous dephasing scattering time of Zr80Sn20-xFex alloys at low temperature
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Anomalous dephasing scattering time of Zr80Sn20-xFex alloys at low temperature

机译:Zr80Sn20-xFex合金在低温下的异常移相散射时间

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We report the results of a comprehensive study of weak electron localization (WEL) and electron-electron interaction (EEL) effects in disordered Zr80Sn20-xFex alloys. The resistivity in absence of magnetic field shows a minimum at temperature T=T-m and follows rho T-5/2(o)1/2 law within the temperature range 5 K <= T <= T-m, which suggests predominant EEL effect. Magnetoresistivity is positive due to strong spinorbit interaction. The dephasing scattering time is dominated by the electron-phonon scattering. The electron-phonon scattering rate shows anomalous behavior and obeys the relation tau(-1)(e-ph) proportional to T(2)le, where l(e) is the electron elastic mean free path. The zero temperature scattering time (tau(0)) strongly depends on the disorder and its magnitude decreases with increasing disorder resistivity rho(0). Such anomalous behavior cannot be explained in terms of existing theories. (C) 2015 Elsevier B.V. All rights reserved.
机译:我们报告了对无序Zr80Sn20-xFex合金中的弱电子定位(WEL)和电子-电子相互作用(EEL)效应的综合研究结果。在没有磁场的情况下,电阻率在温度T = T-m时显示出最小值,并且在5 K <= T <= T-m的温度范围内遵循rho T-5 / 2(o)1/2律,这表明EEL效应占主导地位。由于强自旋轨道相互作用,磁阻为正。相移散射时间主要受电子-声子散射的影响。电子-声子的散射速率显示出异常行为,并且服从与T(2)le成比例的关系tau(-1)(e-ph),其中l(e)是电子弹性平均自由程。零温度散射时间(tau(0))很大程度上取决于无序性,其大小随无序电阻率rho(0)的增加而减小。这种异常行为不能用现有的理论来解释。 (C)2015 Elsevier B.V.保留所有权利。

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