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首页> 外文期刊>Physica status solidi, B. Basic research >Hydrogen passivation of the Si-Ga donor in GaP
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Hydrogen passivation of the Si-Ga donor in GaP

机译:GaP中Si-Ga供体的氢钝化

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In LEC-grown Gap doped with silicon, two vibrational absorption lines are measured at 2175.1 and 2190.3 cm(-1) (T = 7 K). These lines are due to P-H stretching modes where hydrogen passivates Si-Ga donors. Uniaxial stress experiments show that the P-H-Si-Ga complex responsible for the 2175.1 cm(-1) line has trigonal symmetry and is the isolated passivated Si-Ga. The complex creating the 2190.3 cm(-1) line has the symmetry C-s and contains additionally a B-Ga with the four constituents located in an {110} mirror plane. Therefore, also the structure of the group-IV donor-hydrogen complexes is in Gap different from that observed in GaAs. [References: 14]
机译:在掺硅的LEC生长间隙中,在2175.1和2190.3 cm(-1)(T = 7 K)下测量了两条振动吸收线。这些线归因于P-H拉伸模式,其中氢钝化Si-Ga供体。单轴应力实验表明,负责2175.1 cm(-1)线的P-H-Si-Ga复合物具有三角对称性,并且是孤立的钝化Si-Ga。产生2190.3 cm(-1)线的复合物具有C-s对称性,并另外包含B-Ga,其中的四个成分位于{110}镜平面中。因此,IV族供体-氢络合物的结构在Gap中也不同于在GaAs中观察到的结构。 [参考:14]

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